Once again PEM will exhibiting at APEC, the Applied Power Electronic Conference, taking place from the March 20 – 24, Long Beach, California. Come and visit us on Booth 1344 along side our US distributor GMW Associates where our experts will be on hand to discuss PEM’s wide range of CWT and RCT Rogowski technology based wide-bandwidth current probes.
We will be featuring a live demonstration showing how our latest CWTMiniHF AC probes not only provide better common mode immunity to local high voltage transients, but also provide a more precise measurement delay which can be compensated for to give improved power loss measurement in power semiconductors using SiC technology for example.
In addition, we will also be exhibiting our full range of CWT probes from the 1.7mm thick, 30MHz Ultra Mini to our 10kVpeak insulated, wideband, standard probes available in lengths of up to 1m or greater. These versatile probes are ideal for motor drive, power quality and power electronic measurement applications.
We look forward to meeting you at APEC 2016 and discussing your applications and technical requirements.