EPE 17, Warsaw, Poland, 11-14 September 2017 is fast approaching and you can visit us on stand 32 for a live demonstration of our CWT MiniHF AC current probe. This latest addition to our CWT range not only provides better common mode immunity to local high voltage transients, but also provides a more precise measurement delay which can be compensated to give an improved power loss measurement in power semiconductors using SiC technology for example.
In addition we will also be showing our full CWT range of AC current probes, including the CWT, CWT Mini and CWT Ultra Mini. Our Director of Engineering, Jo Aberdeen and Dr Alice Clifford will be available to discuss any application and technical questions that you might have. We are looking forward to meeting you there.
Further information for the conference can be found at http://www.epe2017.com/ 
