If you are visiting APEC 2017, then come along to our booth 925 for a live demonstration of our CWT MiniHF AC current probe.  This latest addition to our CWT  range not only provides better common mode immunity to local high voltage transients, but also provides a more precise measurement delay which can be compensated to give an improved power loss measurement in power semiconductors using SiC technology for example. 

In addition we will also be showing our full CWT range of AC current probes, including the CWT, CWT Mini and CWT Ultra Mini and our technical team will be available to discuss any application and technical questions that you might have.  We are looking forward to meeting you there.