17-21 Sept 2018
Kipsala International Exhibition Centre, Riga, Latvia.
STAND 37
PEM to showcase new CWTMini50HF offering faster rise-times and excellent immunity to local voltage transients.
PEM will be exhibiting at this year’s EPE ’18 ECCE Europe
conference in Riga, Latvia. We’ll be showing our latest CWTMini50HF current probe for high-speed and high power-density power electronic applications. This higher bandwidth probe is ideal for measuring the faster current transients in today’s new semiconductor technologies where faster turn on and turn off times, higher blocking voltages and smaller circuits demand, smaller, higher temperature, faster current probes.
A live GaN FET switch demonstrator featuring a new noise immune, high speed (>50MHz), compact sensor will also be available for delegates to see live.
We will also have our
full range of Rogowski waveform transducers, probes and industrial sensors, including the CWT Mini, Ultra Mini, RCT and CMC ranges.
Further information for the conference can be found at http://www.epe2018.com/
